跳到主要內容區塊

Top

精密離子蝕刻鍍膜系統

 

精密離子蝕刻鍍膜系統

 

  • It is a cost effective, affordable, next-generation apparatus for the preparation of metallographic samples that do not require sputter coating.
  • Typical applications include Scanning Electron Microscopy (SEM or high resolution FESEM) and Light Microscopy (LM).
  • Quality samples are produced in a clean environment, under a controlled process with reproducible results.
  • The ion beam etching technique used avoids the hazards and costs associated with wet chemical etching.

 

儀器設備說明

Ion Guns
Ion gun One Penning ion gun with miniature rare earth magnets
Ion Beam Energy 1.0keV to 10.0keV
Beam Diameter About 5mm FWHM
Ion Current Density 10mA/cm2 Peak
Gas throughput Argon at 0.1cc/minute/gun
Etched Area About 7mm - 10mm dependent on gun energy
Etching Rate Approximately 10µm/hr for Silicon and 3µm/hr for Tungsten at 10.0keV
Airlock Assembly
Sample Holder Accepts 1 inch Metallographic mounts and most SEM stubs
Sample Rotation Variable speed 10 - 60rpm
Sample Tilt Fixed angle or variable rocking angle (0° - 90°)
Sample Rocking Variable speed 5°/sec - 36°/sec
Option TEM adapters for side-entry TEM or SEM holders

收費標準 

  項目 價格 服務對象
1 訓練認證 1500元/梯 中山校內任系所皆可
2 自行操作 200元/時 限經認證許可資格者
    400元/時 中山校內任系所皆可
3 委託操作 600元/時 校外
    1200元/時 一般廠商
備註 儀器操作時間未滿一小時者,以一小時計費

聯絡方式 :  

負責教授:  張六文 教授        工學院 材料與光電科學系       TEL:07-5252000轉4060

聯絡人:  顏采蓉       材料與光電科學系        TEL:07-5252000轉4085

儀器地點:國立中山大學國際研究大樓地下1樓(IR0001)

 

負責教授: 張六文教授
助理: 顏采蓉
聯絡方式: (07)5252000 ext. 4085
瀏覽數: